The two-parameter generalization of Ewens' random partition structure

The two-parameter generalization of Ewens' random partition structure

Report Number
345
Authors
Jim Pitman
Citation
Bernoulli 3, 79-96, 1997
Abstract

A two-parameter generalization of Ewens' random partition structure is obtained by sampling from a random discrete distribution derived by Perman, Pitman and Yor from the lengths of excursions of a recurrent Bessel process.

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